Ultrafast differential sample and hold using low-temperature-grown GaAs MSM for photonic A/D conversion

IEEE Photonics Technology Letters

Volumn 13, Issue 7, 2001, Pages 717-719

  Urata, Ryohei ^a,b   Takahashi, Ryo ^c   Sabnis, Vijit A ^a,d   Miller, David A B ^a,b   Harris Jr , James S ^a,b  

^a IEEE   (United States)

^b STANFORD UNIVERSITY   (United States)

^c NTT CORPORATION   (Japan)

^d Stanford University   (United States)

Author keywords

Analog to digital conversion; Low temperature grown GaAs; Metal semiconductor metal devices; Optical data processing; Sample and hold circuits

Indexed keywords

FEEDTHROUGH NOISE; SAMPLE AND HOLD CIRCUITS; ULTRAFAST DIFFERENTIAL SAMPLE;

BIT ERROR RATE; OPTICAL DATA PROCESSING; OPTICAL SWITCHES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR METAL BOUNDARIES; SPURIOUS SIGNAL NOISE; ULTRAFAST PHENOMENA;

ANALOG TO DIGITAL CONVERSION;

EID: 0035398964     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.930425     Document Type: Article

References (10)

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8. Extending the performance of optically sampled time-demultiplexed analog-to-digital converters
9. Picosecond GaAs-based photoconductive optoelectronic detectors
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