High-pressure phases of V2O5: An application of an in situ X-ray observation method to high-pressure synthesis of materials

Journal of Crystal Growth

Volumn 229, Issue 1, 2001, Pages 467-471

  Kusaba, Keiji ^a   Ohshima, Eriko ^a   Syono, Yasuhiko ^a   Kikegawa, Takumi ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

A1. Characterization; A1. Crystal structure; A1. High resolution X ray diffraction; A1. Low dimensional structures; A1. X ray diffraction; B1. Oxides

Indexed keywords

CRYSTAL STRUCTURE; HIGH PRESSURE EFFECTS IN SOLIDS; HIGH TEMPERATURE EFFECTS; PHASE TRANSITIONS; QUENCHING; X RAY CRYSTALLOGRAPHY;

VANADIUM OXIDE;

VANADIUM COMPOUNDS;

EID: 0035398821     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01209-X     Document Type: Article

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