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Volumn 183, Issue 1-2, 2001, Pages 62-72

Monolayer resolution in medium energy ion scattering

Author keywords

High resolution; Medium energy ion scattering; Surface composition; Surface structures

Indexed keywords

COMPOSITION EFFECTS; MONOLAYERS; PARTICLE BEAM DYNAMICS;

EID: 0035398645     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00384-6     Document Type: Article
Times cited : (15)

References (55)
  • 20
    • 0004647478 scopus 로고    scopus 로고
    • HVEE Ltd. manufacturers, Amersfoort, The Netherlands
  • 31
    • 0004258899 scopus 로고    scopus 로고
    • Alloy Phase Diagrams, ASM International
    • (1999) ASM Handbook , vol.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.