Development of an infrared absorption measurement method using the photothermal deflection effect of thallium bromide iodide (KRS-5): Measurement with a stepped-scan fourier transform infrared spectrometer

Review of Scientific Instruments

Volumn 72, Issue 7, 2001, Pages 2889-2892

  Minato, Hideyuki ^a   Ishido, Yoshinari ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035395436     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1380392     Document Type: Article

References (7)

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3. P. G. Varlashkin and M. J. D. Low, Appl. Spectrosc. 40, 1170 (1986).
4. M. J. Smith, C. J. Manning, R. A. Palmer, and J. L. Chao, Appl. Spectrosc. 42, 546 (1988).
5. H. J. Seo and S. I. Yun, Springer Ser. Opt. Sci. 69, 231 (1992).
6. Y. C. Teng and B. S. H. Royce, Appl. Opt. 21, 77 (1982).
7. P. R. Griffiths and J. A. de Haseth, Fourier Transform Infrared Spectrometry (Wiley, New York, 1986).