Refinement of crystallographic parameters in transition metal disilicides with the C11b, C40 and C54 structures

Intermetallics

Volumn 9, Issue 7, 2001, Pages 603-607

  Tanaka, K ^a   Nawata, K ^a   Inui, H ^a   Yamaguchi, M ^a   Koiwa, M ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

A. silicides, various; B. crystallography; F. diffraction

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; LATTICE CONSTANTS; SILICON; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

TRANSITION METAL DISILICIDES;

TRANSITION METAL ALLOYS;

EID: 0035390363     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(01)00048-6     Document Type: Article

References (12)