Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 394-398

  Paul A ^a,b   Elmrabet, S ^a   Alves, L C ^b   Da Silva, M F ^b   Soares, J C ^b   Odriozola, J A ^a  

^a CSIC   (Spain)

^b INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

Author keywords

EN 1.4301 stainless steel; High temperature oxidation; Silicon diffusion barrier

Indexed keywords

CURVE FITTING; HIGH TEMPERATURE OPERATIONS; ION BEAMS; OXIDATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH TEMPERATURE OXIDATION; ION MICROPROBES; SILICON DIFFUSION BARRIER;

SILICON STEEL;

EID: 0035388395     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00358-5     Document Type: Conference Paper

References (9)