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Volumn 40, Issue 7, 2001, Pages 1315-1320

Fabrication of a waveguiding layer in Teflon AF® by ion irradiation

Author keywords

Fluorpolymer; Ion irradiation; Leaky mode spectroscopy; Optical waveguide

Indexed keywords

FLUORINE CONTAINING POLYMERS; HELIUM; ION BOMBARDMENT; LIGHT ABSORPTION; OPTICAL GLASS; OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES; PRISMS; REFRACTIVE INDEX; SPECTROSCOPY; SUBSTRATES; ULTRAVIOLET RADIATION;

EID: 0035388311     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1385331     Document Type: Article
Times cited : (4)

References (17)
  • 3
    • 84995695675 scopus 로고
    • Teflon AF® Product Information, DuPont USA
    • (1989)
  • 11
    • 0016483923 scopus 로고
    • A new method for measuring refractive index and thickness of liquid and deposited solid thin films
    • (1975) Opt. Commun. , vol.13 , Issue.3 , pp. 327-329
    • Kersten, R.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.