Ion beam analysis of oxidation and hydrogenation of switchable mirrors

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 389-393

  Huisman, M C ^a   Jongerden, M R ^a   Van der Molen, S J ^a   Vis, R D ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

ERDA; H depth profiling; Materials analysis; O depth profiling; Switchable mirrors

Indexed keywords

BACKSCATTERING; DEPTH INDICATORS; HYDRIDES; HYDROGENATION; ION BEAMS; OXIDATION; PHASE DIAGRAMS; RARE EARTH ELEMENTS; THIN FILMS;

DEPTH PROFILING; SWITCHABLE MIRRORS;

MIRRORS;

EID: 0035388018     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00352-4     Document Type: Article

References (11)