메뉴 건너뛰기




Volumn 40, Issue 3, 2001, Pages 385-394

Error corrections for x-ray powder diffractometry

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ERROR CORRECTION; ERRORS; EXTRAPOLATION; LATTICE CONSTANTS; LEAST SQUARES APPROXIMATIONS; POLYNOMIALS;

EID: 0035387707     PISSN: 00084433     EISSN: None     Source Type: Journal    
DOI: 10.1179/cmq.2001.40.3.385     Document Type: Article
Times cited : (19)

References (30)
  • 4
    • 0003875910 scopus 로고
    • X-ray wavelengths
    • US Atomic Energy Commission, Division of Technical Information Extension, Oak Ridge TN, Publication NYO-10586
    • (1964)
    • Beardon, J.A.1
  • 6
    • 4243865819 scopus 로고
    • The intensity distribution in the faces of curved crystals monochromators and an estimate of its influence on precision measurements of lattice parameters
    • (1960) Acta Crystallogr. , vol.13 , pp. 832-835
    • Cermak, J.1
  • 8
    • 4043146536 scopus 로고
    • Counter-tube diffractometer - The effect of dispersion, lorentz and polarization factors on the position of x-ray powder diffraction lines in terms of of the center of gravity of the lines
    • (1959) Acta Crystallogr. , vol.12-14
    • Pike, E.R.1
  • 10
    • 4243922801 scopus 로고
    • Counter-tube diffractometer - The effect of vertical divergence on the displacement and breadth of x-ray powder diffraction lines
    • (1957) J. Sci. Instr. , vol.34-36
    • Pike, E.R.1
  • 12
    • 0003545366 scopus 로고
    • Counter-tube diffractometer - The theory of the use of centroids of diffraction profiles for high accuracy in the measurement of diffraction angles
    • (1959) Brit. J. Appl. Phys. , vol.10 , pp. 57-68
    • Pike, E.R.1    Wilson, A.J.C.2
  • 14
    • 0000765753 scopus 로고
    • Geiger-counter x-ray spectrometer - Influence of size and absorption coefficient of specimen on the position and shape of powder diffraction maxima
    • (1950) J. Sci. Instr. , vol.27 , pp. 321-325
    • Wilson, A.J.C.1
  • 19
    • 4243922797 scopus 로고
    • Comments on diffractometer alignment and calibration problems
    • Apparatus and Standards Committee Report No. 2; American Crystallographic Association, c/o Goodyear Atomic Corp., Piketon, OH
    • (1962)
    • Beu, K.E.1
  • 21
    • 0000894679 scopus 로고
    • The synthesis of x-ray spectrometer line profiles with application to crystallite size measurements
    • (1954) J. Appl. Phys. , vol.25 , pp. 155-161
    • Alexander, L.E.1
  • 24
  • 25
    • 4243922799 scopus 로고    scopus 로고
    • Silicon powder 2θ/d-spacing standard for x-ray diffraction
    • SRM 640b; NBS, Gaithersburg, MD
  • 26
    • 4244083794 scopus 로고    scopus 로고
    • Instrument line position and profile shape standard for x-ray powder diffraction
    • SRM 660; NIST, Gaithersburg, MD


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.