Investigation of single-event charge collection from angled ion strikes

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 340-343

  Mori, Hidenobu ^a   Hirao, Toshio ^b   Stuart Laird, Jamie ^b   Onoda, Shinobu ^a   Kamiya, Tomihiro ^b   Itoh, Hisayoshi ^b   Okamoto, Tsuyoshi ^a   Koizumi, Yoshiharu ^a  

^a TOKAI UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; BIT ERROR RATE; CHARGED PARTICLES; DYNAMIC RANDOM ACCESS STORAGE; ION BEAMS; LSI CIRCUITS; MATHEMATICAL MODELS; STATIC RANDOM ACCESS STORAGE;

MULTIPLE BIT UPSETS (MBU); SINGLE EVENT UPSETS (SEU);

SATELLITES;

EID: 0035387605     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00525-0     Document Type: Conference Paper

References (8)