Microstructures of FeTaN films in the neck region of magnetic recording heads

IEEE Transactions on Magnetics

Volumn 37, Issue 4, 2001, Pages 3039-3042

  Hong, Jongill ^a   Wang, Shan X ^b  

^a FUJITSU LABORATORIES LTD   (Japan)

^b Stanford University   (United States)

Author keywords

Fe based nitride magnetic materials; Head sliders; High saturation moment magnetic materials; Inductive recording heads; Oblique incident deposition

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; IRON ALLOYS; MAGNETIC ANISOTROPY; MAGNETIC HEADS; MAGNETIC RECORDING; X RAY SPECTROSCOPY;

INDUCTIVE RECORDING HEADS;

MAGNETIC THIN FILMS;

EID: 0035386601     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.947059     Document Type: Article

References (12)

1. Writing performance of narrow gap heads made with sputtered laminated FeN materials on 3800 Oe coercivity media
2. 2 inductive write heads using high moment FeAlN poles
3. The effect of surface topography on the soft magnetic properties of FeAlN films
4. Magnetic properties of Fe(N)/NiFe(N) sputtered on sloping surfaces
5. Effects of lamination on soft magnetic properties of FeN films on sloping surfaces
6. Texture and magnetic properties of FeTaN films bias-deposited on sloping surfaces
7. Magnetic and microstructural characterization of FeTaN high saturation materials for recording heads
8. Oblique evaporation and surface diffusion
9. Microstructure and magnetism in FeTaN films deposited in a nanocrystalline state
10. Dependence of geometric magnetic anisotropy in thin iron films
11. Oblique-incidence anisotropy in evaporated permalloy films
12. Anomalous magnetic anisotropy of thin films evaporated at oblique incidence