Read performance of tunneling magnetoresistive heads

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 1687-1690

  Ishihara, K ^b   Nakada, M ^b   Fukami, E ^b   Nagahara, K ^b   Honjo, H ^b   Ohashi, K ^a,b  

^a IEEE

^b NEC CORPORATION   (Japan)

Author keywords

1 F noise; In situ natural oxidation; Shot noise; TMR head

Indexed keywords

FREQUENCY RESPONSE; MAGNETORESISTANCE; READOUT SYSTEMS; SHOT NOISE; TUNNEL JUNCTIONS;

TUNNELING MAGNETORESISTIVE (TMR) HEADS;

MAGNETIC HEADS;

EID: 0035386313     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.950938     Document Type: Article

References (6)

1. Demonstrating a tunneling MR head
2. Evaluation of front flux probe type TMR heads
3. Magnetic tunneling junctions with in situ naturally-oxidized tunnel barrier
4. Electrical noise in hysteretic ferromagnet-insulator-ferromagnet tunnel junctions
5. 1/F noise in saturated GMR heads