CoCrPtTa/Ti perpendicular media deposited at high sputtering rate

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 1319-1322

  Lu, Bin ^a   Klemmer, Timothy ^a   Khizroev, Sakhrat ^a   Howard, J Kent ^a   Litvinov, Dmitri ^a   Roy, Anup G ^b   Laughlin, David E ^b  

^a SEAGATE TECHNOLOGY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Co alloy; Magnetic properties; Microstructure; Perpendicular media; Sputtering rate

Indexed keywords

COBALT ALLOYS; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; GRAIN SIZE AND SHAPE; MAGNETIC PROPERTIES; MAGNETIC RECORDING; SPUTTER DEPOSITION; STACKING FAULTS; TEXTURES;

SPUTTERING RATE;

MAGNETIC THIN FILMS;

EID: 0035386178     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.950829     Document Type: Article

References (7)

1. Microstructure and magnetic properties of CoCr thin films formed on Ge layer
2. Remnant magnetization structures in single-layer perpendicular thin film media
3. Compositional microstructures of CoCr-alloy perpendicular magnetic recording media
4. k⊥ and CoCr with positive inter-particle interaction
5. Role of a paramagnetic amorphous CoZr seed layer in CoCrPt/Ti perpendicular recording media