Evolutions of magnetic and structural properties of FeAlN thin films via N doping

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 1779-1782

  Liu, Yi Kuang ^a   Harris, Vincent G ^b   Kryder, Mark H ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Extended x ray absorption fine structure (EXAFS); Magnetic recording heads; Soft ferromagnetic materials; Sputtered FeAlN thin films

Indexed keywords

CRYSTAL LATTICES; DOPING (ADDITIVES); FERROMAGNETIC MATERIALS; IRON COMPOUNDS; MAGNETIC ANISOTROPY; MAGNETIC HEADS; MAGNETIC RECORDING; NITROGEN; PHASE TRANSITIONS; SOFT MAGNETIC MATERIALS; SPUTTERING; X RAY DIFFRACTION ANALYSIS;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS);

MAGNETIC THIN FILMS;

EID: 0035386049     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.950966     Document Type: Article

References (8)

1. Magnetic disk drives in 2000: Implications for materials research
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3. 2 inductive write heads using high moment FeAlN poles
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5. 3N
6. Magnetization process in nanocrystalline ferromagnets
7. Experimental electrical resistivity of metals