Magnetostatic interactions between sub-micrometer patterned magnetic elements

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 2052-2054

  Janesky, J ^a   Rizzo, N D ^a   Savtchenko, L ^a   Engel, B ^a   Slaughter, J M ^a   Tehrani, S ^a  

^a MOTOROLA INC   (United States)

Author keywords

Interaction; Magnetostatic; MRAM; Patterned; Simulation; Sub micrometer

Indexed keywords

ARRAYS; ASPECT RATIO; ELECTRON BEAM LITHOGRAPHY; MAGNETIC FIELD EFFECTS; MAGNETIZATION; MAGNETOMETERS; NICKEL; RANDOM ACCESS STORAGE;

ALTERNATING GRADIENT FORCE MAGNETOMETRY; MAGNETIC RANDOM ACCESS MEMORY (MRAM); SUB MICROMETER PATTERNED MAGNETIC ELEMENTS;

MAGNETOSTATICS;

EID: 0035386041     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.951050     Document Type: Article

References (9)