Influence of thickness on the optical properties of vacuum-deposited a-Si : H films

Optics and Laser Technology

Volumn 33, Issue 4, 2001, Pages 237-242

  El Naggar, A M ^a,b  

^a Ain Shams University   (Egypt)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

a Si : H; Optical properties; Thickness

Indexed keywords

AMORPHOUS SILICON; ENERGY GAP; LIGHT ABSORPTION; REFRACTIVE INDEX; SPECTROPHOTOMETRY;

FILM THICKNESS;

OPTICAL FILMS;

EID: 0035372860     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(01)00031-7     Document Type: Article

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