SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 388, Issue 1-2, 2001, Pages 114-119

Analysis of X-ray photoelectron spectra of amorphous carbon nitride films

(2) Song, Hongwei a Ilegbusi, Olusegun J a

a Northeastern University (United States)

Author keywords

Carbon nitride; Dual ion beam deposition; X Ray photoelectron spectrum

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARBON NITRIDE; CHEMICAL ACTIVATION; CHEMICAL BONDS; COMPOSITION EFFECTS; FILM PREPARATION; ION BEAM ASSISTED DEPOSITION; ION BOMBARDMENT; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

THERMAL ACTIVATION;

AMORPHOUS FILMS;

EID: 0035372261 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)00848-3 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.