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Volumn 177, Issue 1-2, 2001, Pages 122-128
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Systematic oscillation of peak positions in photoemission spectra during alternating caesium and oxygen exposures of silicon surfaces
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Author keywords
Band bending; Caesium; Heterojunction; Oxidation; Photoelectron spectroscopy; Silicon surfaces
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Indexed keywords
CESIUM;
CHARGE TRANSFER;
ELECTRONIC STRUCTURE;
OSCILLATIONS;
OXIDATION;
PHOTOELECTRON SPECTROSCOPY;
PHOTOEMISSION;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
STOICHIOMETRY;
BAND BENDING;
HETEROJUNCTIONS;
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EID: 0035371471
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00207-0 Document Type: Article |
Times cited : (3)
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References (13)
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