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Volumn 177, Issue 1-2, 2001, Pages 122-128

Systematic oscillation of peak positions in photoemission spectra during alternating caesium and oxygen exposures of silicon surfaces

Author keywords

Band bending; Caesium; Heterojunction; Oxidation; Photoelectron spectroscopy; Silicon surfaces

Indexed keywords

CESIUM; CHARGE TRANSFER; ELECTRONIC STRUCTURE; OSCILLATIONS; OXIDATION; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; STOICHIOMETRY;

EID: 0035371471     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00207-0     Document Type: Article
Times cited : (3)

References (13)
  • 8
    • 0343187341 scopus 로고    scopus 로고
    • in preparation
    • P. Morgen, et al., in preparation.
    • Morgen, P.1
  • 9
    • 24244446829 scopus 로고    scopus 로고
    • in preparation
    • L.-B. Tækker, et al., in preparation.
    • Tækker, L.-B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.