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Volumn 68, Issue 9, 2001, Pages 1081-1094

Subinterfacial cracks in bimaterial systems subjected to mechanical and thermal loading

Author keywords

Coherent shearing interferometer; Finite element method; Stress intensity factor; Subinterfacial crack; Thermal stress

Indexed keywords

ALUMINUM; CRACK PROPAGATION; DISSIMILAR MATERIALS; INTERFACES (MATERIALS); INTERFEROMETRY; POLYMETHYL METHACRYLATES; STRESS INTENSITY FACTORS; THERMAL EFFECTS;

EID: 0035366203     PISSN: 00137944     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-7944(01)00005-4     Document Type: Article
Times cited : (26)

References (9)
  • 5
    • 0018766642 scopus 로고
    • Theoretical and experimental analysis of semi-elliptical surface cracks subject to thermal shock
    • Smith C.W., editor. ASTM STP 677, American Society for Testing and Materials
    • (1979) Fracture Mechanics , pp. 381-398
    • Yagawa, G.1    Ichimiya, M.2    Ando, Y.3
  • 6
    • 0030380953 scopus 로고    scopus 로고
    • Compact polariscope/shearing-interferometer for mapping stress fields in bimaterial system
    • (1996) Expt. Mech , vol.36 , Issue.4 , pp. 404-411
    • Lee, H.1    Krishnaswamy, S.2
  • 8
    • 0027555024 scopus 로고
    • General crack-tip fields for stationary and steadily growing interface cracks in anisotropic bimaterials
    • (1993) J. Appl. Mech , vol.60 , pp. 183-189
    • Deng, X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.