Growth and characterisation of L-cystine doped TGS crystals

Journal of Crystal Growth

Volumn 226, Issue 2-3, 2001, Pages 303-312

  Meera, K ^a   Muralidharan, R ^a   Santhanaraghavan, P ^a   Gopalakrishnan, R ^a   Ramasamy, P ^a  

^a ANNA UNIVERSITY   (India)

Author keywords

A1. Atomic force microscopy; A1. Crystal morphology; A2. Single crystal growth; B2. Dielectric materials; B2. Ferroelectric materials; B3. Infrared devices

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; DOPING (ADDITIVES); FERROELECTRIC MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HARDNESS TESTING; MICROHARDNESS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; X RAY DIFFRACTION ANALYSIS;

CRYSTAL MORPHOLOGY; TRIGLYCINE SULFATE;

SINGLE CRYSTALS;

EID: 0035365929     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)00752-7     Document Type: Article

References (15)