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Volumn 16, Issue 6, 2001, Pages 433-439

Junction effects of p-Cu2O photocathode with layers of hole transfer sites (Au) and electron transfer sites (NiO) at the electrolyte interface

(4) Fernando, C A N a De Silva, L A A b Mehra, R M c Takahashi, K d

a UNIVERSITY OF RUHUNA (Sri Lanka)

b UNIVERSITY OF CINCINNATI (United States)

c UNIVERSITY OF DELHI (India)

d KANAZAWA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTROLYTES; HOLE TRAPS; HYDROGEN; INTERFACES (MATERIALS); PHOTOCURRENTS; PHOTODEGRADATION; QUANTUM EFFICIENCY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR JUNCTIONS; X RAY DIFFRACTION ANALYSIS;

ELECTROLYTE INTERFACES; HOLE TRANSFER SITES;

PHOTOCATHODES;

EID: 0035364826 PISSN: 02681242 EISSN: None Source Type: Journal
DOI: 10.1088/0268-1242/16/6/303 Document Type: Article

Times cited : (23)

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