SCOPUS 정보 검색 플랫폼

Volumn 30, Issue 6, 2001, Pages 637-642

Improvement of the accuracy of the in-situ ellipsometric measurements of temperature and alloy composition for MBE grown HgCdTe LWIR/MWIR structures

(5) Daraselia, M a Garland, J W a Johs, B b Nathan, V c Sivananthan, S a

a UNIVERSITY OF ILLINOIS AT CHICAGO (United States)

b J A WOOLLAM CO INC (United States)

c AIR FORCE RESEARCH LABORATORY (United States)

Author keywords

Alloy composition; CdxZn1 xTe; CdTe; Hg1 xCdxTe; In situ monitoring; LWIR; MWIR; Spectroscopic ellipsometry; Temperature

Indexed keywords

COMPOSITION EFFECTS; COMPUTER SIMULATION; ELLIPSOMETRY; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR GROWTH; TEMPERATURE; TEMPERATURE MEASUREMENT;

CADMIUM ZINC TELLURIDE; IN SITU ELLIPSOMETRIC MEASUREMENT; MERCURY CADMIUM TELLURIDE;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0035359391 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/BF02665848 Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.