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Volumn 40, Issue 6, 2001, Pages 984-990
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Algorithm for resolving 2π ambiguities in interferometric measurements by use of multiple wavelengths
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Author keywords
Interferometric measurement; Monochromatic light; Multiple wavelengths; Optical path length
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Indexed keywords
ALGORITHMS;
INTERFEROMETRY;
MEASUREMENT ERRORS;
MIRRORS;
NUMERICAL ANALYSIS;
WAVEFRONTS;
MULTIPLE WAVELENGTHS;
OPTICAL PATH LENGTH;
WAVEFRONT SENSOR;
MONOCHROMATORS;
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EID: 0035359072
PISSN: 00913286
EISSN: None
Source Type: Journal
DOI: 10.1117/1.1365936 Document Type: Article |
Times cited : (37)
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References (6)
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