Measurement of laser diode astigmatism using the beam-line method

Optical Engineering

Volumn 40, Issue 6, 2001, Pages 995-1000

  Sidorin, Y ^a   Shack, R V ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Gaussian beams; Index guided laser diodes; Laser diode astigmatism; Optical measurement

Indexed keywords

IMAGING TECHNIQUES; LASER APPLICATIONS; LASER BEAMS; OPTICAL DISK STORAGE; OPTICAL VARIABLES MEASUREMENT;

BEAM LINE METHOD; GAUSSIAN BEAMS; INDEX GUIDED LASER STRUCTURE; LASER DIODE ASTIGMATISM;

SEMICONDUCTOR DIODES;

EID: 0035358675     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1369596     Document Type: Article

References (10)

1. Choice of clip levels for beam width measurements using knife-edge techniques
2. Figures of merit for laser beam quality
3. Diode laser astigmatism measurement made easy
4. Measurement of laser diode astigmatism
5. Some characteristics of an extremely-short external-cavity laser diode realized by butt-coupling a Fabry-Perot laser diode to a single-mode optical fiber
6. Spectral dependence of the change in refractive index due to carrier injection in GaAs lasers
7. Carrier induced index change in AlGaAs quantum well lasers