Generalization of a two-dimensional micromagnetic model to nonuniform thickness

Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 7257-7259

  Porter, D G ^a   Donahue, M J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356654     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1363606     Document Type: Article

References (7)

1. M. J. Donahue, D. G. Porter, R. D. McMichael, and J. Eicke, J. Appl. Phys. 87, 5520 (2000).
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3. B. Streibl, T. Schrefl, and J. Fidler, J. Appl. Phys. 85, 5819 (1999).
4. ∼rdm/mumag.html〉
5. M. J. Donahue and D. G. Porter, NISTIR 6376, National Institute of Standards and Technology, 100 Bureau Drive, Gaithershurg, MD 20899.
6. M. J. Donahue and R. D. McMichael, Physica B 233, 272 (1997).
7. R. D. McMichael, M. J. Donahue, D. G. Porter, and J. Eicke, J. Appl. Phys. 85, 5816 (1999).