Exchange bias measurements of CoFe/IrMn

Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 7543-7545

  Brown, H ^a   Dan Dahlberg, E ^a   Hou, C ^b  

^a University of Minnesota   (United States)

^b SEAGATE TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356070     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1358832     Document Type: Article

References (5)

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5. E. D. Dahlberg, B. Miller, B. Hill, B. J. Jönsson, V. Ström, K. V. Rao, J. Nogues, and I. K. Schuller, J. Appl. Phys. 83, 6893 (1998).