Physical vapour deposition growth and transmission electron microscopy characterization of epitaxial thin metal films on single-crystal Si and Ge substrates

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 6, 2001, Pages 1547-1578

  Westmacott, K H ^a   Hinderberger, S ^a   Dahmen, U ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; EPITAXIAL GROWTH; GERMANIUM; PHYSICAL VAPOR DEPOSITION; SILICON; SINGLE CRYSTALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EPITAXIAL THIN METAL FILMS;

METALLIC FILMS;

EID: 0035354594     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610108214362     Document Type: Article

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