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Volumn 81, Issue 5, 2001, Pages 1143-1159

Deformation of copper single crystals to large strains at 4.2 K: II. Transmission electron microscopy observations of defect structure

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER; CRYSTAL DEFECTS; DEFORMATION; ELECTRIC CONDUCTIVITY OF SOLIDS; STRAIN; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035353612     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610108214433     Document Type: Article
Times cited : (38)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.