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Volumn 41, Issue 5, 2001, Pages 513-518

The combined effect of EPMs and TAEs on energetic ion confinement and sawtooth stabilization

Author keywords

[No Author keywords available]

Indexed keywords

CYCLOTRON RESONANCE; DEGRADATION; IONS; PLASMA APPLICATIONS;

EID: 0035353510     PISSN: 00295515     EISSN: None     Source Type: Journal    
DOI: 10.1088/0029-5515/41/5/304     Document Type: Article
Times cited : (27)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.