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Volumn 81, Issue 5, 2001, Pages 351-355

Determination of the depth distribution of subsurface damage during polishing of alumina

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL POLISHING; MICROCRACKS; STRAIN RATE; SURFACE PHENOMENA; X RAY POWDER DIFFRACTION; X RAY SCATTERING;

EID: 0035352111     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/095008300039669     Document Type: Article
Times cited : (8)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.