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Volumn 35, Issue 5, 2001, Pages 608-611

Impact ionization wave breakdown of drift step recovery diodes

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035343759     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1371631     Document Type: Article
Times cited : (12)

References (8)
  • 1
    • 0004292076 scopus 로고
    • Prentice-Hall, Englewood Clifs, 1990; Mir, Moscow, Chap. 6
    • M. Shur, in Physics of Semiconductor Devices (Prentice-Hall, Englewood Clifs, 1990; Mir, Moscow, 1992), Vol. 2, Chap. 6.
    • (1992) Physics of Semiconductor Devices , vol.2
    • Shur, M.1
  • 4
    • 0013393296 scopus 로고
    • I. V. Grekhov and A. F. Kardo-Sysoev, Pis'ma Zh. Tekh. Fiz. 5, 950 (1979) [Sov. Tech. Phys. Lett. 5, 395 (1979)].
    • (1979) Sov. Tech. Phys. Lett. , vol.5 , pp. 395
  • 6
    • 4243184833 scopus 로고
    • I. V. Grekhov, V. M. Efanov, A. F. Kardo-Sysoev, and S. V. Shendereǐ, Pis'ma Zh. Tekh. Fiz. 9, 435 (1983) [Sov. Tech. Phys. Lett. 9, 188 (1983)].
    • (1983) Sov. Tech. Phys. Lett. , vol.9 , pp. 188


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.