Analysis of the stochastic error of stationary Monte Carlo device simulations

IEEE Transactions on Electron Devices

Volumn 48, Issue 5, 2001, Pages 985-992

  Jungemann, Christoph ^a,b   Meinerzhagen, Bernd ^a,b  

^a IEEE   (Germany)

^b UNIVERSITY OF BREMEN   (Germany)

Author keywords

Device simulation; Error analysis; Monte Carlo methods; Semiconductor device noise; Silicon

Indexed keywords

PARTICLE DENSITY; SEMICONDUCTOR DEVICE NOISE; STOCHASTIC ERROR;

COMPUTER SIMULATION; CORRELATION METHODS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ERROR ANALYSIS; ESTIMATION; MONTE CARLO METHODS; RANDOM PROCESSES; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE;

SEMICONDUCTOR DEVICE TESTING;

EID: 0035340603     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.918247     Document Type: Article

References (39)