Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits

Microelectronics Reliability

Volumn 41, Issue 5, 2001, Pages 773-777

  Mrooz, O ^a   Kovalski, A ^a   Pogorzelska, J ^b   Shpotyuk, O ^a   Vakiv, M ^a   Butkiewicz, B ^b   Maciak, J ^b  

^a SCIENTIFIC RESEARCH COMPANY CARAT   (Ukraine)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; THERMISTORS; THERMOELECTRICITY;

IN-RUSH CURRENT PROTECTION; THERMOELECTRICAL DEGRADATION PROCESSES;

MICROELECTRONICS;

EID: 0035340456     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00027-0     Document Type: Article

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14. Degradation of ceramic thermoresistors under impulse current loads