Shunt screening, size effects and I/V analysis in thin-film photovoltaics

Journal of Applied Physics

Volumn 89, Issue 9, 2001, Pages 4975-4985

  Karpov, V G ^b   Rich, G ^b   Subashiev, A V ^a,b   Dorer, G ^b  

^a PETER THE GREAT ST PETERSBURG POLYTECHNIC UNIVERSITY   (Russian Federation)

^b FIRST SOLAR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035340395     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1359158     Document Type: Article

References (7)

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2. J. J. Wysocki, RCA Rev. 22, 57 (1961).
3. L. D. Nielsen, IEEE Trans. Electron Devices 29, 821 (1982).
4. I. L. Eisgruber, J. R. Sites, Proceedings of 24th Photovoltaic Specialists Conference, Hawaii, Dec. 5-9, 1994, p. 271.
5. For brevity, we use the same letter p for specific resistances in both one- and two-dimensional cases, where it has the dimensions of Ω/cm and Ω/□, respectively
6. G. Lukovsky, J. Appl. Phys. 31, 1088 (1960).
7. M. A. Green, Solar Cells, in Modern Semiconductor Device Physics, edited by S. M. Sze (Wiley, New York, 1998), p. 473.