Excess noise in thick film piezoresistors on a metallic substrate

Measurement Science and Technology

Volumn 12, Issue 5, 2001, Pages 582-588

  Crescini, D ^a   Marioli, D ^a   Sardini, E ^a   Taroni, A ^a  

^a UNIVERSITY OF BRESCIA   (Italy)

Author keywords

Excess noise; Metallic substrates; Noise measurement; Thick film piezoresistors

Indexed keywords

ALUMINA; RESISTORS; SUBSTRATES; THICK FILMS;

RETIRING CYCLES;

PIEZOELECTRIC DEVICES;

FILM; MEASUREMENT METHOD; NOISE; RESISTOR;

EID: 0035339397     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/5/305     Document Type: Article

References (14)

1. Holmes P J 1973 Changes in thick film resistor values due to substrate flexure Microelectron. Reliability 12 395-6
2. Canali C, Malavasi D, Morten B, Prudenziati M and Taroni A 1980 Strain sensitivity in thick film resistors J. Appl. Phys. 51 3282-8
3. Prudenziati M 1994 Thick Film Sensors (Amsterdam: Elsevier) pp 85-97
4. Masoero A, Morten B, Tamborin M and Prudenziati M 1995 Excess noise in thick film resistors: volume dependence Microelectron. Int. 37 5-8
5. Marioli D, Rolla P and Taroni A 1993 Insulated metal substrates for thick film sensor applications ISHM Proc. 9th European Hybrid Microelectronics Conf. (Nice) pp 261-8
6. Crescini D, Marioli D and Taroni A 1996 Piezoresistive accelerometers: two examples in thick-film technology Sensors Actuators A 41/42 275-8
7. Crescini D, Marioli D and Taroni A 1997 Piezoresistive accelerometers for vehicle dynamics: a new solution in thick-film technology on AISI430 metal substrate Sensor Mater. 8 431-8
8. Neri B, Pellegrini B and Saletti R 1991 Ultra low-noise preamplifier for low-frequency noise measurements in electron devices IEEE Trans. Instrum. Meas. 40 2-6
9. Conrad G T, Newman N and Stansbury P 1960 A recommended standard resistor-noise test system IRE Trans. Comp. Parts 7 71-85
10. Muller F and Wolf M 1988 Dependence of the sheet resistivity and current noise behaviour of the grain size and volume fraction of conducting material in thick-film resistors experiments Active Passive Electron. Comp. 13 1-6
11. Kolek A and Dziedzic A 2000 Low-frequency noise of polymer thick-film resistors: analysis of volume and contact effects Proc. 22nd Int. Conf. on Microelectronics (Niš, Yugoslavia) pp 531-4
12. Prudenziati M, Morten B and Masoero A 1981 Excess noise and refiring process in thick film resistors J. Phys. D: Appl. Phys. 14 1355-62
13. Hrovat M, Samardzija Z and Hole J 2000 Microstructural, XRD and electrical characterization of some thick film resistors J. Mater. Sci.: Mater. Electron. 11 199-208
14. Hrovat M, Belavic D, Samardzija Z and Hole J 2000 Characteristics of thick-film resistors, fired under dielectric layer J. Mater. Sci. Lett. 19 1551-5