Perspectives: Moving the market to embedded memory

IEEE Design and Test of Computers

Volumn 18, Issue 3, 2001, Pages 5-6

  Shubat, Alex ^a  

^a Virage Logic   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF REPAIR; EMBEDDED MEMORY; SILICON ON CHIP;

ALGORITHMS; BUILT-IN SELF TEST; COST EFFECTIVENESS; ELECTRIC POWER SUPPLIES TO APPARATUS; EMBEDDED SYSTEMS; LOGIC DESIGN; MICROPROCESSOR CHIPS; REDUNDANCY; RELIABILITY; REPAIR; YIELD STRESS;

RANDOM ACCESS STORAGE;

EID: 0035339176     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.922798     Document Type: Article

References (0)