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Journal of Materials Science

Volumn 36, Issue 9, 2001, Pages 2213-2225

Biaxial fragmentation of thin silicon oxide coatings on poly(ethylene terephthalate)

(6) Leterrier, Y a Pellaton, D a Mendels, D a Glauser, R a Andersons, J b Manson J A E a

a LABORATOIRE DE TECHNOLOGIE DES COMPOSITES ET POLYMÈRES LTC (Switzerland)

b UNIVERSITY OF LATVIA (Latvia)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CRACK INITIATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; PRESSURIZATION; SILICON COMPOUNDS; STRAIN; STRESS ANALYSIS; WEIBULL DISTRIBUTION;

BIAXIAL FRAGMENTATION; EQUIBIAXIAL STRESS LOADING; THIN SILICON OXIDE COATINGS;

POLYETHYLENE TEREPHTHALATES;

EID: 0035336906 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1017552302379 Document Type: Article

Times cited : (37)

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