Detailed structural analysis of Ce doped Si thin films

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 10, Issue 1-3, 2001, Pages 237-241

  Yokota, T ^a   Fujimura, N ^a   Morinaga, Y ^a   Ito, T ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Expanded epitaxial growth Si; Microstructure; Spin glass; Superparamagnetism

Indexed keywords

ANNEALING; CERIUM; CRYSTAL MICROSTRUCTURE; DEPOSITION; DIAMAGNETISM; ELECTRON BEAMS; EPITAXIAL GROWTH; EVAPORATION; MAGNETIC SEMICONDUCTORS; MAGNETIC SUSCEPTIBILITY; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; SPIN GLASS; SUPERPARAMAGNETISM; VACUUM APPLICATIONS;

DILUTED MAGNETIC SEMICONDUCTORS; ELECTRON TRANSMISSION DIFFRACTION ANALYSIS;

SEMICONDUCTING FILMS;

EID: 0035336586     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(01)00090-X     Document Type: Article

References (5)

1. Extended abstract
2. Extended abstract
3. Extended abstract