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Volumn 24, Issue 5, 2001, Pages 66-76

Industry divides on low-k dielectric

(1)  Peters, Laura a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MECHANICAL POLISHING; COPPER; CROSSTALK; DIELECTRIC DEVICES; ELECTRIC CONNECTORS; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0035336330     PISSN: 01633767     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (2)
  • 1
    • 0003742630 scopus 로고    scopus 로고
    • Low-k Dielectrics Get Respectable
    • April
    • L. Peters, "Low-k Dielectrics Get Respectable," Semiconductor International, April 2001, p. 15.
    • (2001) Semiconductor International , pp. 15
    • Peters, L.1
  • 2
    • 0007147364 scopus 로고    scopus 로고
    • Pursuing the Perfect Low-k Dielectric
    • September
    • L. Peters, "Pursuing the Perfect Low-k Dielectric," Semiconductor International, September 1998, p. 64.
    • (1998) Semiconductor International , pp. 64
    • Peters, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.