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Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films

Volumn 19, Issue 3, 2001, Pages 910-915

Chemical and structural characterization of La0.5Sr0.5MnO3 thin films prepared by pulsed-laser deposition

(6) Decorse, P a Quenneville, E a Poulin, S a Meunier, M a Yelon, A a Morin, F b

a ÉCOLE POLYTECHNIQUE DE MONTRÉAL (Canada)

b HYDRO QUÉBEC (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALINE EARTH METAL COMPOUNDS; ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ENERGY DISPERSIVE SPECTROSCOPY; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM SURFACES; SURFACE CONCENTRATIONS;

THIN FILMS;

EID: 0035335227 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.1368200 Document Type: Article

Times cited : (29)

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