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Volumn 51-52, Issue 1-4, 2001, Pages 515-521

A micro-aperture electrostatic field mill based on MEMS technology

Author keywords

Electrotastic field measurements; Field meter; Field mill; MEMS; Micro electromechanics; Resonant comb drive

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC FIELD MEASUREMENT; ELECTROSTATICS; MICROELECTROMECHANICAL DEVICES; MICROMACHINING;

EID: 0035335012     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3886(01)00048-1     Document Type: Article
Times cited : (89)

References (18)
  • 2
    • 0004830315 scopus 로고
    • Electrometer for ionization chamber using metal-oxide semiconductor field effect transistor
    • (1964) Rev. Sci. Instrum , vol.35 , Issue.1 , pp. 1587
    • McCaslin, J.B.1
  • 5
    • 0016473036 scopus 로고
    • The design of simple instruments for measurement of charge on insulating surfaces
    • (1975) J. Electrostat , vol.1 , Issue.1 , pp. 27-36
    • Secker, P.E.1
  • 6
    • 84915676177 scopus 로고
    • The use of field-mill instruments for charge density and voltage measurement
    • (1975) IOP Conf. Series , vol.27 , pp. 137-181
    • Secker, P.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.