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Volumn 63, Issue 5, 2001, Pages

Measurements of coherent diffraction radiation and its application for bunch length diagnostics in particle accelerators

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRON DIFFRACTION; INTERFEROMETERS; PARTICLE BEAM BUNCHING; PERTURBATION TECHNIQUES; SILICON WAFERS; SUBMILLIMETER WAVES;

EID: 0035334073     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.63.056501     Document Type: Article
Times cited : (98)

References (17)
  • 6
    • 29444442519 scopus 로고    scopus 로고
    • A.H. Lumpkin and C.E. Eyberger
    • W. Barry, in Beam Instrumentation, edited by A.H. Lumpkin and C.E. Eyberger, AIP Conf. Proc. No. 390 (AIP, New York, 1997), p. 173.
    • (1997) Beam Instrumentation , pp. 173
    • Barry, W.1
  • 16
    • 0033314126 scopus 로고    scopus 로고
    • B. Leissner, Ch. Berger, R. Siedling, M. Tonutti, M. Geitz, G. Schmidt, and P. Schmuser, in Proceedings of the 1999 Particle Accelerator Conference, edited by A. Luccio and W. MacKay (unpublished), p. 2172
    • B. Leissner, Ch. Berger, R. Siedling, M. Tonutti, M. Geitz, G. Schmidt, and P. Schmuser, in Proceedings of the 1999 Particle Accelerator Conference, edited by A. Luccio and W. MacKay (unpublished), p. 2172.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.