A probabilistic model for the response of an electrically short two-conductor transmission line driven by a random plane wave field

IEEE Transactions on Electromagnetic Compatibility

Volumn 43, Issue 2, 2001, Pages 130-139

  Bellan, Diego ^a,b   Pignari, Sergio ^a,b  

^a IEEE   (Italy)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

Field coupling; Probabilistic immunity models; Radiated susceptibility; Transmission lines

Indexed keywords

PROBABILISTIC MODELS;

ELECTRIC LOADS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC FIELDS; INDUCED CURRENTS; MAGNETIC SUSCEPTIBILITY; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION;

ELECTRIC LINES;

EID: 0035332453     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.925532     Document Type: Article

References (21)

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15. A probabilistic model for the transmission line voltages induced by an external field
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