A Bayesian predictive software reliability model with pseudo-failures

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans.

Volumn 31, Issue 3, 2001, Pages 233-238

  Pham, L ^a   Pham, H ^a  

^a DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

Likelihood ratios; Software reliability; Sum of square errors; Time between failures; Weibull distribution

Indexed keywords

FAILURE ANALYSIS; HAZARDS; RANDOM PROCESSES; WEIBULL DISTRIBUTION;

SOFTWARE RELIABILITY;

COMPUTER SOFTWARE;

EID: 0035329959     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/3468.925663     Document Type: Article

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