Scale dependency of image derivatives for feature measurement in curvilinear structures

International Journal of Computer Vision

Volumn 42, Issue 3, 2001, Pages 177-189

  Streekstra, G J ^a   Van Den Boomgaard, R ^b   Smeulders, A W M ^b  

^a ACADEMIC MEDICAL CENTER   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Bias removal; Center line detection; Curvature; Curvilinear structures; Diameter measurement; Feature measurement; Image derivatives; Localization; Scale

Indexed keywords

CONVOLUTION; FEATURE EXTRACTION; MATHEMATICAL MODELS; MECHANICAL VARIABLES MEASUREMENT;

CURVILINEAR STRUCTURES;

IMAGE ANALYSIS;

EID: 0035328711     PISSN: 09205691     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1011191615794     Document Type: Article

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