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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 5 A, 2001, Pages 3375-3376

Crystallization of Ag-In-Sb-Te phase-change optical recording films

(4) Chou, Lih Hsin a Chang, Yem Yeu a Chai, Yeong Cherng a,c Wang, Shiunn Yeong b

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

b Lead Data Inc (Taiwan)

c Picvue Electronics Company (Taiwan)

Author keywords

Activation energy; Ag In Sb Te film; Laser annealing; Microstructures; Optical recording; Phase change; Thermal annealing

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; LASER APPLICATIONS; MICROSTRUCTURE; OPTICAL RECORDING; X RAY DIFFRACTION ANALYSIS;

OPTICAL RECORDING FILMS;

OPTICAL FILMS;

EID: 0035328658 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.3375 Document Type: Article

Times cited : (10)

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