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Volumn 40, Issue 5 B, 2001, Pages 3538-3543

Characterization of homogeneity of langasite wafers using bulk-wave measurement

Author keywords

Bulk wave; Characterization; Homogeneity; Langasite

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; CRYSTAL GROWTH; LANTHANUM COMPOUNDS; NATURAL FREQUENCIES; NONDESTRUCTIVE EXAMINATION; PIEZOELECTRIC MATERIALS; SURFACE WAVES; THICKNESS MEASUREMENT;

EID: 0035327956     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.3538     Document Type: Article
Times cited : (8)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.