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Volumn 40, Issue 5 B, 2001, Pages 3538-3543
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Characterization of homogeneity of langasite wafers using bulk-wave measurement
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Author keywords
Bulk wave; Characterization; Homogeneity; Langasite
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Indexed keywords
ACOUSTIC SURFACE WAVE DEVICES;
CRYSTAL GROWTH;
LANTHANUM COMPOUNDS;
NATURAL FREQUENCIES;
NONDESTRUCTIVE EXAMINATION;
PIEZOELECTRIC MATERIALS;
SURFACE WAVES;
THICKNESS MEASUREMENT;
BULK-WAVE MEASUREMENTS;
LANGASITE WAFERS;
SINGLE CRYSTALS;
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EID: 0035327956
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.40.3538 Document Type: Article |
Times cited : (8)
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References (16)
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