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Volumn 19, Issue 3, 2001, Pages 628-633
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Technique employing gold nanospheres to study defect evolution in thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
GOLD;
LITHOGRAPHY;
MULTILAYERS;
SILICON WAFERS;
SUBSTRATES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
GOLD NANOSPHERES;
NANOSTRUCTURED MATERIALS;
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EID: 0035326270
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1364702 Document Type: Conference Paper |
Times cited : (10)
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References (8)
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