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Volumn 20, Issue 5, 2001, Pages 365-375

Maximum-likelihood expectation-maximization reconstruction of sinograms with arbitrary noise distribution using NEC-transformations

Author keywords

[No Author keywords available]

Indexed keywords

LOG CONVERTED TRNSMISSION SINOGRAMS; SINGLE PHOTON EMISSION TOMOGRAPHY (SPECT);

EID: 0035324511     PISSN: 02780062     EISSN: None     Source Type: Journal    
DOI: 10.1109/42.925290     Document Type: Article
Times cited : (71)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.