Novel interferometric frequency discriminators for low noise microwave applications

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 48, Issue 3, 2001, Pages 743-749

  Hartnett, John G ^b   Tobar, Michael E ^a,b   Ivanov, Eugene N ^b  

^a IEEE

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY STABILITY; INTERFEROMETRY; MICROWAVE OSCILLATORS; NATURAL FREQUENCIES; RESONATORS; SCATTERING PARAMETERS; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE;

FREQUENCY DISCRIMINATORS (FD);

DISCRIMINATORS;

ARTICLE;

EID: 0035324487     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.920704     Document Type: Article

References (9)

1. A new microwave technique for determining noise spectra at frequencies close to the carrier
2. A microwave system for measurement of AM and PM noise spectra
3. Microwave frequency discriminator with a cryogenic sapphire resonator for ultra-low phase noise
4. Applications of interferometric signal processing to phase noise reduction in microwave oscillators
5. Advanced phase noise suppression technique for the next generation of ultra-low noise microwave oscillators
6. Microwave interferometry: Application to precision measurements and noise reduction techniques
7. Ultra-low noise microwave oscillator with advanced phase noise suppression system
8. Effects of spurious modes in cavity resonators
9. Secondary frequency standards: Frequency temperature compensated resonator design and improved frequency discriminators